Polarization Imaging Systems
Measure birefringence, retardation, principal-axis orientation, internal stress, material structure, and polarization-dependent behavior using static, high-speed, rheological, and automated inspection solutions.
See Stress and Structure That Standard Cameras Cannot
Polarization imaging reveals optical properties that conventional intensity imaging does not directly show. It can visualize and quantify changes caused by internal stress, molecular orientation, material thickness, refractive behavior, and dynamic deformation.
Photron’s polarization portfolio includes high-resolution static measurement systems, the Crysta high-speed camera, an integrated polarized rheology platform, and automated mapping systems for production and laboratory inspection.
Explore the Polarization Product Range
Choose a solution based on whether the measurement is static or dynamic, the expected retardation range, the specimen size, and whether the system will be used in research or automated inspection.
Série PA
The PA Series measures birefringence and phase difference in glass and other low-phase-difference targets, combining rapid measurement with high spatial resolution.
Série WPA
The WPA Series measures birefringence and phase-difference distribution across three wavelengths, expanding the measurable range for larger and higher-retardation transparent products.
Crysta
A high-speed two-dimensional polarization camera for visualizing rapidly changing birefringence, retardation, internal stress, orientation structure, and impact or fracture mechanisms.
Rheo-Iris
Rheo-Iris combines an Anton Paar MCR-series rheometer with the Crysta polarization camera to measure rheological properties while visualizing structural changes in soft matter in real time.
In-Line / Off-Line Mapping System
An automated high-speed polarization scanning system for inspecting and recording phase-shift and principal-axis orientation uniformity in optical films and other manufactured materials.
PI / WPI Cameras
PI and WPI cameras acquire polarization information in real time at high resolution. They support object recognition, laser-beam monitoring, inspection, research, and OEM integration.
Ellipsometric Measurement
High-speed, non-destructive measurement of thin-film thickness and refractive index across full-area wafers, with high-resolution modes for examining small regions in greater detail.
VRG-100
Dedicated equipment for evaluating retardation and polarization performance in VR-related optical components, including pancake optics and lenses requiring low-retardation uniformity.
Polarization System Comparison
Use this overview to identify the measurement approach that best matches the material, event speed, measurement range, and operating environment.
| System | Measurement Type | Primary Range or Capability | Typical Target | Operating Mode | Best Fit |
|---|---|---|---|---|---|
| Série PA | Static birefringence and phase difference | 0–130 nm; 5-megapixel imaging | Glass and low-retardation transparent components | Laboratory or inspection | High-resolution low-phase-difference measurement |
| Série WPA | Wide-range static birefringence | 0–3,500 nm using three wavelengths | Large transparent resin and optical products | Laboratory or inspection | High-retardation and larger-component measurement |
| Crysta | Dynamic 2D polarization imaging | High-speed measurement with 1.3 MHz core sampling | Transparent materials, fluids, impact and fracture events | High-speed research | Rapidly changing stress and orientation structures |
| Rheo-Iris | Rheology plus polarization imaging | Simultaneous structural and physical-property data | Soft matter and complex fluids | Integrated rheological testing | Material development and formulation optimization |
| Mapping System | Automated area inspection | Phase-shift and axis-orientation uniformity maps | Optical films and manufactured transparent materials | In-line or off-line | Production quality control and process monitoring |
| PI / WPI Cameras | Real-time polarization imaging | DOLP, axis orientation, Stokes parameters and DOP | Objects, laser beams, inspection and OEM systems | Real-time imaging | Polarization signatures and partial-polarization analysis |
| Ellipsometric Systems | Thin-film thickness and refractive index | Full-area wafers up to 12 inches | Semiconductor wafers and thin films | Laboratory or process control | High-volume, non-destructive film evaluation |
| VRG-100 | VR lens retardation and polarization evaluation | RGB wavelength measurement | Pancake optics and VR-related components | Dedicated optical inspection | High-speed VR lens quality evaluation |
Select the Right Polarization Measurement Method
The best system depends on the optical behavior of the specimen, how quickly it changes, the expected retardation, required field of view, spatial resolution, and whether the result is intended for research or production control.
Polarization Imaging Applications
Polarization systems support research, development, optical inspection, manufacturing control, and advanced material characterization.
Internal Stress
Visualize stress distributions in transparent materials during loading, impact, cutting, vibration, and fracture.
Optical Components
Measure birefringence and phase-difference uniformity in glass, lenses, films, resins, and precision optical products.
Complex Fluids
Observe molecular orientation and flow-induced structural changes in polymers, gels, suspensions, and viscoelastic fluids.
Impact and Fracture
Study transient stress concentration, crack initiation, propagation, fragmentation, and impact-response mechanisms.
Film Inspection
Map phase-shift and principal-axis uniformity during development, quality assurance, and continuous production.
Optical Interferometry
Perform non-contact, quantitative, single-shot imaging of optical phase fields, including dynamic sound-field visualization.
Measurement Planning and System Integration
Successful polarization imaging begins with the specimen, expected optical response, event duration, illumination, and required output—not only the camera or sensor.
Build the Complete Measurement Workflow
Photron can help define the polarization system, optics, wavelength, illumination, specimen arrangement, calibration process, recording conditions, and output required for your application.
- Identify the expected birefringence and retardation range
- Determine whether the phenomenon is static or rapidly changing
- Define the specimen size, field of view, and smallest feature
- Select illumination wavelength and optical configuration
- Plan calibration, synchronization, processing, and data export
Which polarization system fits your material or process?
Share the specimen material, size, expected retardation, event speed, measurement area, wavelength constraints, and required output with Photron.