WIDE-RANGE BIREFRINGENCE MEASUREMENT SYSTEMS FOR VISUALIZING RESIDUAL STRESS
Our near infrared systems (NIR), operating at 850nm and 940nm wavelengths, provide powerful tools for production and quality control of samples not transparent at visible light wavelengths, such as special resins and chacolgenide used, for example in LIDAR and face recognition systems.
Objects that are opaque to light will appear black to ‘normal’ visible spectrun cameras, but are transparent at other light wavelengths and can reveal a great deal of information about their composition and the residual stress induced during their manufacture.
These new systems operating in the Near Infrared range enable measurment of objects that were previously impossible to evaluate.
Measureing residual stress in materials that are opaque to the visible spectrum of light.
TWO DIMENSIONAL BIREFRINGENCE MEASUREMENT SYSTEMS
Our wide-range birefringence measurement PA/WPA series systems provide high-speed birefringence measurement of transparent and semi-transparent materials, such as lenses and other transparent components, for residual stress evaluation, or transparent films for phase uniformity evaluation.
Ranging from microscopic to macroscopic (～50cm), the field of view can be adapted to pretty much any measurement FOV. Regardless of your subject matter, we believe we have a system for every size.
The dedicated software supplied provides such options as changing the field of view size and increased measurement range for high-retardation samples. Various filters, such as noise reduction or local variation enhancement etc., are provided to help your data analysis tasks, plus configurable and multiple filters can be applied simultaneously. Software analysis functionality is also available to extend PA/WPA system functionality to meet your most demanding polarization imaging needs.
Measurement of the retardation and orientation andle in:
- PC and PMMA
- PVA, CO, TAC, and PET
- As well as other transparent or semi-transparent materials